Randomized benchmarking and process tomography for gate errors in a solid-state qubit.
نویسندگان
چکیده
We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.
منابع مشابه
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ورودعنوان ژورنال:
- Physical review letters
دوره 102 9 شماره
صفحات -
تاریخ انتشار 2009